Park Systems Introduces Park NX-Tip Scan Head – The Automated Atomic Force Microscopy System for measuring Ultra Large and Heavy Flat Panel Displays
To answer the increasing demand for AFM based metrology on larger flat panel displays, Park Systems has introduced the NX-Tip Scan Head, which overcomes nanometrology challenges for sample dimensions over 300mm and weights above 1kg. The Tip Scanning Head (TSH) Mehr




